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HUSTIR > College of Engineering > Department of Electronic Engineering > Monograph > Item 310993100/5004

Please use this identifier to cite or link to this item: http://ir.hust.edu.tw/dspace/handle/310993100/5004

Title:	厚度效應對氧化鋅薄膜的光學與電學特性的影響
Authors:	魏福順;葉冠廷;鄭博聰;吉川大祐;劉家伸
Contributors:	修平科技大學電子工程系
Keywords:	觸控導電薄膜
Date:	2015-12
Issue Date:	2016-05-14T08:08:39Z
Abstract:	"近年來觸控導電薄膜科技進步，廣泛使用的ITO(Indium Tin Oxide) 透明導電膜雖然具有良好的導電性及透光度，但是近年銦礦價格越來越高，勢必要尋找其他透明導電材料來取代ITO 薄膜，而ZnO (Zinc Oxide)薄膜具有高穩定性且寬能隙(3.34eV)，熱穩定及化學穩定性佳，並且有易蝕刻、資源豐富、成本低、無毒性的優勢，是非常具有潛力的材料。"
Appears in Collections:	[Department of Electronic Engineering] Monograph

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