Hsiuping University of Science and Technology Institutional Repository : Item 310993100/1338

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HUSTIR > College of Engineering > Department of Electrical Engineering & Graduate Institute > Journal > Item 310993100/1338

Please use this identifier to cite or link to this item: http://ir.hust.edu.tw/dspace/handle/310993100/1338

Title:	Proceedings of the 6th ROC sympostum on Reliability and Maintainability
Authors:	W.-S. Liu
Date:	2005-09
Issue Date:	2009-02-03T06:51:55Z
Relation:	Reliability issues in VLSI. P87~90.
Appears in Collections:	[Department of Electrical Engineering & Graduate Institute] Journal

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