Hsiuping University of Science and Technology Institutional Repository : Item 310993100/1372

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HUSTIR > College of Engineering > Department of Electronic Engineering > Journal > Item 310993100/1372

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题名:	Characterization of ultra-thin electroless barriers grown by a self-aligned deposition process on silicon-based dielectric films
作者:	S. T. Chen;G. S. Chen
日期:	2004
上传时间:	2009-02-03T07:00:47Z
關聯:	J. Electrochem. Soc. 151, D99－D105. (SCI)
显示于类别:	[Department of Electronic Engineering] Journal

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