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HUSTIR > College of Engineering > Department of Electrical Engineering & Graduate Institute > Monograph > Item 310993100/3896

Please use this identifier to cite or link to this item: http://ir.hust.edu.tw/dspace/handle/310993100/3896

Title:	極化電壓對陶瓷薄膜特性的影響
Authors:	曾培凱;賴世宗
Contributors:	電機工程系
Date:	2011-12-07
Issue Date:	2013-12-05T08:47:14Z
Abstract:	本專題研究是利用溶膠-凝膠法(sol-gel method)配合旋轉塗佈(Spin-coating)技術製備在AL金屬材質之基板上的PZT(Piezoelectric materials)薄膜，分別探討極化電壓、極化距離、極化時間對薄膜強度及特性之影響。將溶膠-凝膠法(sol-gel method)製作完成的PZT溶液，以旋轉塗佈法(spin-coating)將PZT溶液塗佈於AL基板上再進行熱處理，熱處理完成後使用不同的電壓進行極化處理，以強化其PZT膜之結構強度並將內部的電耦極矩轉向，再以XRD、SEM及精密阻抗分析儀探討其微結構與電性分析。
Appears in Collections:	[Department of Electrical Engineering & Graduate Institute] Monograph

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