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HUSTIR > College of Engineering > Department of Electronic Engineering > Monograph > Item 310993100/7610

Please use this identifier to cite or link to this item: http://ir.hust.edu.tw/dspace/handle/310993100/7610

Title:	建置奈米薄膜及奈米柱陣列量測技術
Authors:	潘泓宇李亮戴銘漢蔡秉翰
Contributors:	電子工程系
Keywords:	ZNO 氧化鋅奈米柱奈米薄膜
Date:	2021-06
Issue Date:	2021-08-30T03:47:36Z
Abstract:	當初在做這個專題前我們組員都對於氧化鋅的量測頗有興趣，我們利用三年級上下學期的時間跟學長討教有關於氧化鋅奈米薄膜和奈米柱陣列的原理和特性量測，上學期我們做好機台基本的操作流程的圖和資料的建檔，下學期負責機台的操作和製作成影片檔，將實驗室中製程及量測設備操作步驟全部電腦建檔數位語音化。
Appears in Collections:	[Department of Electronic Engineering] Monograph

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